產品介紹 Products
產品系列
| 分類 | 標題 | 細節 |
|---|---|---|
| Metrology | Rudolph NSX105 (Parts Machine) |
Illumination, Dark Field, Source Assy NSX105 Flash Pack Power Box DF Source |
| Metrology | NIKON NWL860 WAFER LOADER |
Wafer inspection :Type : TMB 6″ / 8″ Auto Loader Nikon NWL860-TMB Nikon Eclipse L200 microscope + stage Refubish Complete |
| Metrology | RUDOLPH FE-VIID |
Defect inspection system Dual Wavelength S/N : 10727 , Vintage :2002 , |
| Metrology | Rudolph AXI-935 Defect Inspection |
1. Macro Inspection System 2. Vintage : 2007 3. Wafer Size : 300 mm |
| Metrology | Rudolph FE-IV |
1.Thickness measurement . 2. Model: FE-IV 3. Application 200 mm |
| Metrology | Alcatel Adixen DGC 1001 Helium Leak Detector |
1. Helium Detector 2. Model: DGC1001 3. Maker : Alcatel / Adixen |
| Metrology | KLA UV-1280SE |
1. 150mm-200mm Wafers. 2. Measures Film Thickness. 3. Refractive Index and Extinction Coefficient. |